Ключевые слова: LTS, NbTi, cables, microwave devices, filaments, wires, flexibility, fabrication
Ключевые слова: LTS, Nb, rings, Nb3Sn, coatings, cavity, cryogenic systems, cryocoolers, microwave devices, helium liquid, test results
Ключевые слова: measurement setup, squid, detector, thermal properties, experimental devices, microwave devices, review
Ключевые слова: neural networks, microwave devices, HTS, YBCO, thin films, substrate single crystal, filter, modeling, design
Ключевые слова: microwave devices, cables, flexibility, joints, design, fabrication, Nb, resistive transition, experimental results
Ключевые слова: LTS, NbN, NbTi, films, design parameters, measurement technique, microwave devices, penetration depth, temperature dependence
Ключевые слова: FCC, colliders, cavity, electronics, microwave devices, review
Ключевые слова: LTS, Nb3Sn, coatings, cavity, microwave devices, fabrication, test results, X-ray diffraction, microstructure, resistive transition
Fujii Y., Ishida T., Matsuda K., Oshima T., Akamatsu H., Endo A., Karatsu K., Tamura Y., Taniguchi A., Takekoshi T., Bakx T.J., Bueno J., Huiting R., Kohno K., Kouchi A., Llombart N., Maekawa J., Nakatsubo S., Laguna A.P., Thoen D.J., Yates S.J., Baselmans J.J., Rybak M., Brackenhoff S., Buijtendorp B.T., Dabironezare S.O., Doing A., Fujita K.* 6, Gouwerok M.* 2, Hahnle S., Ishii S., Kawabe R., Kitayama T., Murugesan V.*31, Werf P.P.
Ключевые слова: spectrometer, measurement technique, microwave devices, space application
Ключевые слова: LTS, Nb3Sn, bulk, vortex dynamics, pinning, measurement technique, microwave devices, surface impedance, flux flow resistance, upper critical fields, flux creep
Ключевые слова: HTS, YBCO, thin films, microwave devices, impedance, measurement technique, substrate sapphire, meander
Ключевые слова: cryogenic systems, aviation application, electronics, microwave devices, power equipment
Ключевые слова: measurement technique, microwave devices, surface impedance
Ключевые слова: microwave devices, cavity, cryogenic systems, accelerator magnets, test results
Kim S., Xu T., Elliott K., Hartung W., Popielarski J., McGee K., Ganshyn A., Metzgar E., Ostroumov P., Popielarski L., Taylor A., Kelly M.P., Guilfoyle B., Reid T.
Ключевые слова: cavity, accelerator magnets, microwave devices, operational performance, LTS, Nb
Ключевые слова: level sensor, cryogenic systems, nitrogen liquid , measurement technique, microwave devices
Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, critical current, modeling, pinning, Jc/B curves, irradiation effects, microwave devices, defects, Jc/B curves, vortex structures, critical current density, angular dependence, nanorods, defects columnar, experimental results, numerical analysis
Malginov V.A., Smirnov A.V., Parshin V.V., Serov E.A., Bubnov G.M., Vdovin V.F., Nikolenko A.S., Lesnov I.V., Gunbina A.A., Dolzhenko D.E., Khokhlov D.R.
Ключевые слова: HTS, YBCO, coated conductors, optical properties, frequency dependence, cryogenic systems, microwave devices
Ключевые слова: HTS, Bi2212, thin films, MOD process, substrate SrTiO3, inkjet printing, microstructure, microwave devices, fabrication
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Ключевые слова: ITER, irradiation effects, neutron diffraction, quench protection, electronics, microwave devices, test results
Ключевые слова: HTS, YBCO, bulk, fabrication, microwave devices, sintering, sol gel process, comparison, X-ray diffraction, resistive transition, microstructure, critical caracteristics, Jc/B curves
Ключевые слова: HTS, YBCO, nanoparticles, oxygen, composition, fabrication, sol gel process, microwave devices, lattice parameter, X-ray diffraction, magnetization, temperature dependence, size effect
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Ключевые слова: HTS, YBCO, YGdBCO, coated conductors, MOCVD process, fabrication, control systems, microwave devices, surface, experimental results, numerical analysis
Petrisor T., Ciontea L., Celentano G., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Mos R.B., Nasui M., Pinto V., Piperno L., Frolova A.
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